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Relationships between yield losses caused by angular leaf spot on beans and disease severity


Author:
Silva, M.B. da, Paula, T.J. de Jr, Zambolim, L., Leal, B.G., and Costa, H.
Source:
Other US
Year:
2003
Subject:
Phaseolus vulgaris, beans, fungal diseases of plants, Phaeoisariopsis griseola, plant pathogenic fungi, pathogenicity, disease severity, crop yield, leaf area, measurement, and developmental stages
Format:
p. 161-162.
Language:
English
Collection:
USDA publications
Permanent URL:
http://handle.nal.usda.gov/10113/IND43757236