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Subjects crop yield Remove constraint crop yield: crop yield Subjects disease control Remove constraint disease control: disease control Subjects wheat Remove constraint wheat: wheat
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Description:
Paper presented at the New Application of Statistic Tools in Plant Pathology symposium, 94th annual meeting of the American Phytopathological Scoeity, July 20, 2002, Milwaukee, Wisconsin.
Author:
Rosenberg, M.S. , Garrett, K.A. , Su, Z. , Bowden, R.L.
Subject:
Triticum aestivum , wheat , plant pathogens , pathogenicity , leaves , plant pathology , disease severity , disease control , fungicides , nematicides , crop yield , yield components , data collection , statistical analysis , mathematical models , equations
Collection:
Journal Articles, USDA Authors, Peer-Reviewed
Year:
2004